If you would like to read a bit on DPC beforehand, we suggest these papers:

The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy,
J.N. Chapman, P.E. Batson, E.M. Waddell, R.P. Ferrier,
Ultramicroscopy,1978,2,203 - 214, no.3

The Investigation of Magnetic Domain-structures In Thin Foils By Electron-microscopy, Chapman, J. N.,
Journal of Physics D - Applied Physics,1984,4,p 623--,17

Differential phase contrast 2.0 - Opening new "fields" for an established technique,
Lohr Matthias, Schregle Ralph, Jetter Michael, Waechter Clemens, Wunderer Thomas, Scholz Ferdinand, Zweck, Josef,
Ultramicroscopy, 2012, 7-14,117

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy,
Knut Mueller-Caspary, Florian F. Krause, Tim Grieb, Stefan Loeffler, Marco Schowalter, Armand Beche, Vincent Galioit, Dennis Marquardt, Josef Zweck, Peter Schattschneider, Johan Verbeeck, Andreas Rosenauer,
Ultramicroscopy, 2016

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction,
Mueller Knut, Krause Florian F., Beche Armand, Schowalter Marco, Galioit Vincent, Loeffler Stefan, Verbeeck Johan, Zweck Josef, Schattschneider Peter, Rosenauer Andreas,
Nat Commun, 2014,5653,5

Electron microscopy: Atomic resolution comes into phase,
Nellist, Peter D., Nature Physics, 2012, 586--587, 8,

Differential phase-contrast microscopy at atomic resolution,
Shibata Naoya, Findlay Scott D., Kohno Yuji, Sawada Hidetaka, Kondo Yukihito, Ikuhara Yuichi,
Nature Physics, 2012, 8, 611--615, 8

Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy,
Shibata Naoya, Findlay Scott D., Sasaki Hirokazu, Matsumoto Takao, Sawada Hidetaka, Kohno Yuji, Otomo Shinya, Minato Ryuichiro, Ikuhara Yuichi,
Sci. Rep., 2015, 5

On detector linearity and precision of beam shift detection for quantitative differential phase contrast applications,
Zweck J., Schwarzhuber F., Wild J., Galioit V., Ultramicroscopy, 2016,